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Conference

International Conference on Defects-Recognition, Imaging and Physics in Semiconductors


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International Conference on Defects-Recognition, Imaging and Physics in Semiconductors focuses on all aspects of defects in semiconductors including point, line, planar and volume defects studied by a variety of tools. Most recent advances in the field of defect analysis will be discussed. This comprehensive approach has allowed for a discussion of the multifaceted effects of growth, processing, device fabrication as well as their interrelationships, and how to approach the study of defects.

Timings

09:00 AM-06:00 PM (expected)
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Participants

upto 100 DelegatesEstimated Count

Category & Type

Conference
Science & Research

Editions

08-12 Sep 2019


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Ferdinand Braun Institute, Leibniz Institute for High Frequency Technology Germany

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Yash Pandey

Yash Pandey

Student at Ulm university

Ulm, Germany

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