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SPIE Optical Metrology

21 - 24 Jun 2021 New Date Reminder
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Present your research at SPIE Optical Metrology, the premier European conference where scientists, engineers, researchers, and product developers gather to discuss the latest research in measurement systems, modeling, multimodal sensing, and inspection. The conference topics will be cover Optical Measurement Systems for Industrial Inspection, Modeling Aspects in Optical Metrology, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials, Multimodal Sensing: Technologies and Applications, Automated Visual Inspection and Machine Vision, O3A: Optics for Arts, Architecture, and Archaeology.


Timings

09:00 AM-06:00 PM (expected)
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Entry Fees

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Participants

upto 100
Delegates
Based on previous editions

Category & Type

Conference
Electric & Electronics
Science & Research

Editions

Jun 2021


Frequency Not Available

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Online Editions
SPIE Optical Metrology 21 - 25 Jun 2021
1 Followers
Event Happened Alongside1 more event

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Spie- International Society For Optical EngineeringRenowned

USA225 Total Events / 114 Upcoming Events

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ICM

Messe Munchen GmbH Messegelande 81823 Munchen
Munich, Germany

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