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The University of Alabama in Huntsville and Sandia National Laboratories conducted research on the effects of total ionizing dose on SRAM power-up state. The increasing vulnerability of electronic devices to threats and inspection has led to a focus on physical inspection and assurance. Efforts by industry and government to address supply chain security problems have resulted in numerous programs and solutions. While the digital domain receives much attention, there are also opportunities for unique countermeasures through physical assurance and inspection, as well as physical fingerprinting based on analog parameters.
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Timings09:00 AM-06:00 PM (expected)Not Verified | Entry FeesCheck Official Website |
Estimated Turnout100 - 500 Delegates Based on previous editions | Event TypeConference |
EditionsOct 2023 Interested+1 more edition Frequency Annual | Official LinksWebsiteContactsReport Error Claim this event |
Different Located Editions Washington DC, USA30 Nov - 02 Dec 2021 5 Followers | |
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