The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in test, validation, yield, reliability and security of .. Read more microelectronic circuits and systems. News for authors: Starting from 2021, VTS review process is DOUBLE BLIND with REBUTTAL, for both scientific papers and industrial application short papers. The references do not count towards the page limit. You are invited to participate and submit your contributions to VTS’21.
- Share your Experience