22 - 26 Feb 2021

Metrology, Inspection, and Process Control for Semiconductor Manufacturing Conference



09:00 AM - 06:00 PM
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Estimated Turnout

100 - 500
Based on previous editions


Feb 2021


Newly Listed
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Conference Sessions At A GlanceWelcome and Plenary Presentation1: Metrology Keynote Session2: Overlay Accuracy I3: Challenges and New Methods4: .. Read more Inspection5: X-Ray and High Aspect Ratio Metrology6: Contour Metrology7: Roughness Metrology8: Process Control9: Scatterometry10: Nanosheet and Nanowire11: Edge Placement Error12: Overlay Accuracy IIKarel Urbanek Best Student Paper Award13: Metrology and Inspection for the EUV Era14: Late BreakingPoster Session

Divyesh Sorathiya

Divyesh Sorathiya

CMD at Tanneng Electronics India LLP

Rajkot, India
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