Optics Damage and Materials Processing by EUV/X-ray Radiation XDam8 Conference

The conference will be devoted to the study of damage to optical elements and patterning of material surfaces irradiated by high average and/or high peak fluxes of radiation in the extreme ultraviolet and x-ray spectral regions. The following main subjects will be covered by the conference: irreversible changes occurring in solids exposed to synchrotron radiation, high-order harmonics, discharge- and laser-plasma based sources of incoherent EUV/x-ray radiation, and EUV/x-ray laser beams, .. continue reading including free-electron lasers (FELs) chain scissions and crosslinking in EUV/x-ray-exposed polymers, esp. EUV/x-ray resists relationships between EUV/x-ray desorption, ablation and phase transitions transient phenomena pumped and/or probed by short or ultra-short EUV/x-ray pulses influence of radiation damage to samples on their imaging and structural analysis EUV/x-ray laser induced periodic surface structures (EUV/x-ray LIPSS) direct micro- and nano-patterning by intense EUV/x-ray radiation modulated by masks or in interferometers optimization of irradiation conditions to produce tailored micro(nano)structures comparing responses of thin film coatings, multilayer structures, gratings and bulk materials to intense short-wavelength radiation radiation damage to interfaces dual action of short (EUV/x-ray) and long (UV/Vis/NIR) wavelength radiation on solid surfaces advanced diagnostics for investigation of formation and development changes initiated in and on various materials and structures by intense EUV/x-ray radiation thermally induced transient deformations of optical surfaces and related wave-front changes (thermal lensing) challenges for radiation damage and material processing studies associated with the current development of compact, high-repetition EUV/x-ray free-electron lasers, often called cw FELs utilization of damage patterns on irradiated surfaces to characterize the EUV/x-ray radiation field analytical techniques and procedures for detailed characterization of changes in irradiated condensed phase formation of carbonaceous deposit (carbon black) from residual gases on irradiated surfaces computer simulation of processes induced in solids by EUV/x-ray pulses at microscopic and macroscopic levels calculations of damage limits for optical components used with intense short-wavelength radiation sources strategies for the design of optical elements to avoid or reduce their EUV/x-ray radiation damage.