The IEEE International Test Conference (ITC) is a yearly event focused on electronics test, featuring a technical program, tutorials, workshops, and an exhibition floor. It is the leading conference dedicated to testing electronic devices, boards, and systems, encompassing all aspects from design verification to failure analysis and process improvement.
Timings09:00 AM-06:00 PM (expected)
Entry FeesCheck Official Website
Estimated Turnout100 - 500
DelegatesBased on previous editions
EditionsOct 2023, Anaheim
Oct 2021, Online
+2 more editions
Next edition likely in Oct 2024
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