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International Conference on Frontiers of Characterization and Metrology for Nanoelectronics will bring together scientists and engineers interested in all aspects of the characterization technology needed for nano electronic materials and device research, development, and manufacturing. It will summarize major issues and provided critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nano electronics and beyond.
Timings9:00 AM - 6:00 PM (General) | Entry FeesFree Ticket For Industry ProfessionalsCheck Official Website |
Estimated Turnout100 - 500 Delegates Based on previous editions | Category & TypeConferenceElectric & Electronics Science & Research |
EditionsJun 2022+2 more editions Frequency Biennial Next edition likely in Jun 2024 | Official LinksWebsiteContactsReport Error Claim this event |
| Different Located Editions Dresden, Germany14 - 16 Apr 2015 2 Followers | |
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27 Jun 2022
Nicholas AntoniouVisitor VP Product Management at PrimeNano Inc.Santa Clara, USA
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