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International Conference on Frontiers of Characterization and Metrology for Nanoelectronics will bring together scientists and engineers interested in all aspects of the characterization technology needed for nano electronic materials and device research, development, and manufacturing. It will summarize major issues and provided critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nano electronics and beyond.
Timings9:00 AM - 6:00 PM (General) | Entry FeesFree Ticket For Industry ProfessionalsCheck Official Website |
Participants100 - 500 Delegates Based on previous editions | Category & TypeConferenceElectric & Electronics Science & Research |
EditionsMar 2022 Interested+2 more editions Frequency Biennial | Official LinksWebsiteContactsReport Error Claim this event |
Different Located Editions Dresden, Germany14 - 16 Apr 2015 2 Followers | |
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User Community [ Users who have shown interest for this Event ]

Liz Martínez
Marketing at PARK SYSTEMS MICROSCOPY, S.A. DE C.V.
Ciudad de Mexico, Mexico
Nicholas Antoniou
VP Product Management at PrimeNano Inc.
Santa Clara, United States
David Su
Director at Yi Xiang Investment Company
Hsinchu, Taiwan
KWONYONGSU
Student at University
Incheon, South Korea
suresh
Director, Product Marketing at Comet Technologies Inc
San Jose, United States
Khalid H Alsayed
Student at University of Dayton
Dayton, United StatesWrite a Review
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Monterey Marriott
350 Calle Principal, Monterey, CA 93940
USA
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