International Conference on Frontiers of Characterization and Metrology for Nanoelectronics

International Conference on Frontiers of Characterization and Metrology for Nanoelectronics will bring together scientists and engineers interested in all aspects of the characterization technology needed for nano electronic materials and device research, development, and manufacturing. It will summarize major issues and provided critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nano electronics and beyond.