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Conference

International Conference on Frontiers of Characterization and Metrology for Nanoelectronics

20 - 23 Jun 2022 New Date Reminder
Monterey Marriott, Monterey, USAGet Directions
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International Conference on Frontiers of Characterization and Metrology for Nanoelectronics will bring together scientists and engineers interested in all aspects of the characterization technology needed for nano electronic materials and device research, development, and manufacturing. It will summarize major issues and provided critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nano electronics and beyond.


Timings

9:00 AM - 6:00 PM (General)

Entry Fees

Free Ticket For Industry ProfessionalsCheck Official Website

Estimated Turnout

100 - 500
Delegates
Based on previous editions

Category & Type

Conference
Electric & Electronics
Science & Research

Editions

Jun 2022
+2 more editions

Frequency Biennial
Next edition likely in Jun 2024

Official Links

WebsiteContacts


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Different Located Editions
Dresden, Germany14 - 16 Apr 2015
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350 Calle Principal, Monterey, CA 93940
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