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1st EditionConference

IEEE International Conference On Artificial Intelligence Testing

04 - 09 Apr 2019 New Date Reminder
DoubleTree by Hilton Hotel Newark - Fremont, Newark, USAGet Directions
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The IEEE International Conference On Artificial Intelligence Testing intends to provide an international forum for researchers and practitioners to exchange novel research results, to articulate the problems and challenges from practices, to deepen the understanding of the subject area with new theories, methodologies, techniques, processes models, etc., and to improve the practices with new tools and resources.


Timings

09:00 AM-06:00 PM (expected)
Not Verified

Entry Fees

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Estimated Turnout

100 - 500
Delegates
Based on previous editions

Category & Type

Conference
Education & Training
IT & Technology

Editions

Apr 2019 1st Edition


Frequency Not Available

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Oxford, UK23 - 26 Aug 2021
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map of DoubleTree by Hilton Hotel Newark - Fremont
DoubleTree by Hilton Hotel Newark - Fremont

39900 Balentine Dr, Newark, CA 94560
USA

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