2nd Edition Conference

IEEE International Conference on Artificial Intelligence Testing

13 - 16 Apr 2020 Add To Calendar
Keble College, Oxford, UK

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IEEE International Conference on Artificial Intelligence Testing provides an international forum for researchers and practitioners to exchange novel research results, to articulate the problems and challenges from practices, to deepen our understanding of the subject area with new theories, methodologies, techniques, processes models, etc., and to improve the practices with new tools and resources. This conference covers the following topics areas are testing AI applications, applications of ai techniques to software testing, data quality checking for ai applications and etc.


09:00 AM-06:00 PM (expected)
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100 - 500

10 - 50 Exhibitors Estimated Count

Category & Type

IT & Technology


13 - 16 Apr 2020 Interested

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University of Strathclyde

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Mr at Leedsbeckett

Harrogate, United Kingdom
Adejimi Adesola Johnson

Adejimi Adesola Johnson

Principal manager,Data storage Admin at National Identity management Commission

Abuja, Nigeria
Wolfram Research Europe Ltd.

Wolfram Research Europe Ltd.

Computation at Wolfram Research Europe Ltd.

Oxford, United Kingdom
Manasawee Kaenapornpan

Manasawee Kaenapornpan

Lecturer at MSU

Talat, Thailand
51.758836 -1.257954

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