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IEEE International Conference on Artificial Intelligence Testing provides an international forum for researchers and practitioners to exchange novel research results, to articulate the problems and challenges from practices, to deepen our understanding of the subject area with new theories, methodologies, techniques, processes models, etc., and to improve the practices with new tools and resources. This conference covers the following topics areas are testing AI applications, applications of ai techniques to software testing, data quality checking for ai applications and etc.
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Timings12:00 AM - 12:00 AM (General)
| Entry FeesCheck Official Website |
Estimated Turnout100 - 500 Delegates Based on previous editions | Event TypeConference |
EditionsAug 2021+1 more edition Frequency Annual | Official LinksWebsiteContactsReport Error Claim this event |
Different Located Editions Newark, USA04 - 09 Apr 2019 7 Followers | |
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Oxford Martin School
34 Broad St, Oxford OX1 3BD, UK
UK
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