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IEEE International Conference On Artificial Intelligence Testing

23 - 26 Aug 2021 New Date Reminder
Oxford Martin School, Oxford, UKGet Directions
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IEEE International Conference on Artificial Intelligence Testing provides an international forum for researchers and practitioners to exchange novel research results, to articulate the problems and challenges from practices, to deepen our understanding of the subject area with new theories, methodologies, techniques, processes models, etc., and to improve the practices with new tools and resources. This conference covers the following topics areas are testing AI applications, applications of ai techniques to software testing, data quality checking for ai applications and etc.

Timings

12:00 AM - 12:00 AM (General)

Entry Fees

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Estimated Turnout

100 - 500
Delegates
Based on previous editions

Event Type

Conference

Editions

Aug 2021
+1 more edition

Frequency Annual

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Different Located Editions
Newark, USA04 - 09 Apr 2019
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Oxford Martin School

34 Broad St, Oxford OX1 3BD, UK
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