10times
2nd Edition Conference

IEEE International Conference on Artificial Intelligence Testing

13 - 16 Apr 2020 Add To Calendar
Keble College, Oxford, UK

About Users 5 Reviews Exhibitors Photos Speakers Travel Deals

IEEE International Conference on Artificial Intelligence Testing provides an international forum for researchers and practitioners to exchange novel research results, to articulate the problems and challenges from practices, to deepen our understanding of the subject area with new theories, methodologies, techniques, processes models, etc., and to improve the practices with new tools and resources. This conference covers the following topics areas are testing AI applications, applications of ai techniques to software testing, data quality checking for ai applications and etc.


Timings

09:00 AM-06:00 PM (expected)
Not Verified

Entry Fees

Check Official Website

Participants

100 - 500
Delegates

10 - 50 Exhibitors Estimated Count

Category & Type

Conference
IT & Technology

Editions

13 - 16 Apr 2020 Interested


Frequency Newly Listed

Official Links

WebsiteContacts


Report Error
Claim this event

Organizer

Logo Send Stall Book Request

University of Strathclyde

32 Total Events / 4 Upcoming Events
+ Add me as user

User Community [ Users who have shown interest for this Event ]

GoingUchereal2010@yahoo.com

Uchereal2010@yahoo.com

Mr at Leedsbeckett

Harrogate, United Kingdom
Adejimi Adesola Johnson

Adejimi Adesola Johnson

Principal manager,Data storage Admin at National Identity management Commission

Abuja, Nigeria
Wolfram Research Europe Ltd.

Wolfram Research Europe Ltd.

Computation at Wolfram Research Europe Ltd.

Oxford, United Kingdom
Manasawee Kaenapornpan

Manasawee Kaenapornpan

Lecturer at MSU

Talat, Thailand
51.758836 -1.257954

Venue Map & Directions

map of Keble College

Keble College

Oxford OX1 3PG
UK

Get Directions

Featured Hotels in Oxford

More Hotels