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27th Edition Conference

IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

20 - 23 Jul 2020
Sands Expo and Convention Centre, Singapore

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IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits will continue to focus on the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of wear-out and failure in conventional and new CMOS devices, in turn resulting in improved knowhow of the physics of device / circuit / module failure that serves as critical input for future design for reliability.


Timings

09:00 AM-06:00 PM (expected)
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Entry Fees

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Participants

upto 100
Delegates
Estimated Count

Category & Type

Conference
Electric & Electronics
Medical & Pharma

Editions

20 - 23 Jul 2020 Interested


Frequency Newly Listed

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Singapore Unversity of Technology & Design

5 Total Events / 3 Upcoming Events
1.283563 103.860687

Venue Map & Directions

map of Sands Expo and Convention Centre

Sands Expo and Convention Centre

10 Bayfront Avenue 018956
Singapore

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