IEEE International Reliability Physics Symposium

IEEE International Reliability Physics Symposium is the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, it seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment. It provides numerous opportunities for attendees to increase their knowledge and understanding of all aspects of microelectronics reliability. It is also an outstanding chance to meet and network with reliability colleagues from around the world.

Speakers (past edition)

Speaker

Kaizad Mistry

Vice President, Director of Logic Technology Integration at Intel Portland, Australia

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Speaker

Brent Keeth

Senior Fellow--Advanced DRAM Architecture Group at Micron Technology Boise, United States

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