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Conference

International Symposium for Testing and Failure Analysis

15 - 19 Nov 2020  New Date Reminder
Pasadena Convention Center, Pasadena, USA
About Followers 3 Reviews Exhibitors Photos Speakers Travel Deals

International Symposium for Testing and Failure Analysis will highlight areas like Board and System Level FA, Competitive Analysis and Reverse Engineering, Detecting Counterfeit Microelectronics, Emerging FA Techniques and Concepts, FA Process, FA Techniques Addressing the Challenges of, Heterogeneous Systems in Package, Metrology, and In-line Device Characterization, Nanoprobing, Electrical Characterization, etc.


Timings

09:00 AM-06:00 PM (expected)
Not Verified

Entry Fees

Check Official Website

Participants

100 - 500
Delegates
Based on previous editions

Category & Type

Conference
Science & Research
IT & Technology

Editions

15 - 19 Nov 2020
05 - 09 Nov 2017


Frequency Triennial
Next edition likely in Nov 2023

Official Links

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Different Located Editions
Portland, USA 10 - 14 Nov 2019
14 Followers
Phoenix, USA 28 Oct - 01 Nov 2018
10 Followers
Fort Worth, USA 06 - 10 Nov 2016
2 Followers
Houston, USA 09 - 13 Nov 2014
1 Followers

Organizer

Logo Follow Company

A. S. M. International (american Society For Materials)

USA 44 Total Events / 7 Upcoming Events

User Community [ Users who have shown interest for this Event ]

Jason Chuang

Jason Chuang

Engineer at Peregrine semiconductor

San Diego, United States
Dan Belilos

Dan Belilos

Engineer at MICL

Kiryat Tiv'on, Israel
Jennifer Cocle

Jennifer Cocle

Researcher at Hydro-Québec

Montreal, Canada

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