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Conference

IEEE VLSI Test Symposium

05 - 08 Apr 2020 Add To Calendar

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IEEE VLSI Test Symposium will cover areas like Analog/Mixed-Signal/RF Test, ATPG & Compression, Hardware Security, Low-Power IC Test, Memory Test, and Repair, On-Line Test & Error Correction, Embedded System & Board Test, Embedded Test Methods, Emerging Technologies Test, Transients and Soft Errors, and Yield Optimization.


Timings

09:00 AM-06:00 PM (expected)
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Entry Fees

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Participants

upto 100
Delegates
Estimated Count

Category & Type

Conference
IT & Technology

Editions

05 - 08 Apr 2020 Interested


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Xilinx Spain

5 Total Events / 3 Upcoming Events
32.716000 -117.161000

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Venue to be announced

San Diego, USA

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